Profile Analysis Tensiometers
Advanced instruments for surface and interfacial characterization.
Introducing
PAT-X
A new platform for interface characterization.
PAT-X is currently under development. It represents the next step in SINTERFACE instrumentation, combining modern hardware architecture, integrated software and advanced laboratory workflows. Further technical information will be released as development progresses.
Development Status
Currently under development
Development overview
A new measurement platform currently under development.
PAT-X is being developed as a new platform for advanced interface characterization. The project combines modern instrument hardware, integrated software and a revised operating concept within one system architecture.
The development focuses on measurement reliability, efficient laboratory workflows and the possibility of extending the platform with future methods and configurations.
Instrument architecture
Modern hardware and mechanical design focused on precision, reliability and long-term operation.
Integrated workflow
A coordinated environment for instrument control, data acquisition and scientific evaluation.
Future expansion
A platform architecture prepared for additional methods, accessories and software functions.
Current status
Technical specifications, available configurations and the expected release schedule will be published as development progresses.
PAT-X
Platform Highlights
Designed around tomorrow`s laboratory workflows.
PAT-X is currently under development with a focus on modern hardware, integrated software and a modular platform architecture designed for future scientific applications.
Instrument Architecture
Modern mechanical and electronic platform designed for precision and long-term reliability.
Integrated Software
Unified software environment for instrument control, acquisition and data evaluation.
Automation
Expanded automation functions supporting efficient laboratory workflows.
Connectivity
Designed for integration into modern laboratory and network infrastructures.
Modular Platform
Prepared for future measurement methods, accessories and software extensions.
User Experience
Intuitive operating concept developed for scientific users and daily laboratory work.
Development Preview
Engineering the next chapter
of interface characterization.
PAT-X is currently under development. The instrument shown below represents the current industrial design direction. Technical specifications and available configurations will be released as the development progresses.
Development Preview
Designed for tomorrow`s laboratories.
Additional information regarding measurement capabilities, software, hardware architecture and laboratory integration will become available throughout the development process.
PAT-X
Discuss the PAT-X development with our team.
Contact SINTERFACE Technologies for general information about the PAT-X development project and future product announcements. Additional technical details will be communicated as they become available.
Contact our team
Product specifications and availability have not yet been finalized.